Mariam Momenzadeh

 

      List of Archival Journal Publications

  1. " Analysis of Missing and Additional Cell Defects in Sequential Quantum-Dot Cellular Automata", M. Momenzadeh, J. Huang and F. Lombardi, accepted, to appear in Integration the VLSI Journal 2007.

  2. "Tile-Based QCA Design Using Majority-Like Logic Primitives", M. Momenzadeh, J. Huang, L. Schiano, M. Ottavi, and F. Lombardi, ACM Journal on Emerging Technologies in Computing Systems vol. 1, no. 3, pp.163-185, 2006.

  3. "Measuring the Timing Jitter of ATE in the Frequency Domain", L. Schiano, M. Momenzadeh, F. Zhang, Y. J. Lee, T. Kane, S. Max, P. Perkins, Y-B. Kim, F. Lombardi and F. J. Meyer, IEEE Transactions on Instrumentation and Measurement vol. 55, issue 1, pp. 280-289, 2006.

  4. "On the Evaluation of Scaling of QCA Devices in the Presence of Defects at Manufacturing" , M. Momenzadeh, J. Huang, M.B. Tahoori and F. Lombardi, IEEE Transactions on Nanotechnology, vol. 4, issue 6, pp. 740-743, 2005.

  5. "Characterization, Test and Logic Synthesis of And-Or-Inv (AOI) Gate Design for QCA Implementation", M. Momenzadeh, J. Huang, M.B. Tahoori and .F. Lombardi, accepted, to appear in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 24, issue 12, pp. 1881-1893, 2005.

  6. "Testing of Quantum Cellular Automata", M B. Tahoori, M. Momenzadeh, J. Huang and F. Lombardi, IEEE Transactions on Nanotechnology, vol. 3, no. 4, pp. 432-442, 2004.

 

      List of Articles in Refereed Conference Proceedings

  1. "Defect Tolerance of QCA Tiles", M. Momenzadeh, J. Huang and F. Lombardi, Design, Automation and Test in Europe Conference (DATE), vol. 1, pp. 1-6, 2006..

  2. "Modeling QCA Defects at Molecular-level in Combinational Circuits", M. Momenzadeh, M. Ottavi and F. Lombardi, IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 208-216, 2005.

  3. "Defect Characterization and Tolerance of QCA Sequential Devices and Circuits", J. Huang, M. Momenzadeh and F. Lombardi, IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 199-207, 2005.

  4. "Simulation-based Design of Modular QCA Circuits", J. Huang, M. Momenzadeh, L. Schiano and F. Lombardi, IEEE Conference on Nanotechnology, Paper WE-P7-1, IEEE CD-ROM 05TH8816C, 2005.

  5. "Design and Characterization of an And-Or-Inverter(AOI) Gate for QCA Implementation", J. Huang, M. Momenzadeh, M.B. Tahoori and F. Lombardi, ACM Great Lakes Symposium on VLSI, pp. 426-429, 2004.

  6. "Quantum Cellular Automata: New Defects and Faults for New Devices", M. Momenzadeh, M.B. Tahoori, J. Huang and F. Lombardi, International Parallel and Distributed Processing Symposium (IPDPS), pp. 207-214, 2004.

  7. "Frequency Domain Measurement of Timing Jitter in ATE", L. Schiano, M. Momenzadeh, F. Zhang, Y. Lee, Y-B; Kim, F. Lombardi, F.J. Meyer, T. Kane, S. Max, P. Perkins, IEEE Instrumentation and Measurement Technology Conference, vol.3, pp. 2150-2155, 2004.

  8. "Defects and Fault Characterization in Quantum Cellular Automata", M.B. Tahoori, M. Momenzadeh, J. Huang and F. Lombardi, Nanotechnology Conference, vol. 3, pp.190-193, 2004.

  9. "Defect Characterization for Scaling of QCA Devices", J. Huang, M. Momenzadeh, M.B. Tahoori and F. Lombardi, IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 30-38, 2004.

  10. "Defects and Faults in Quantum Cellular Automata at Nano Scale", M.B. Tahoori, M. Momenzadeh, J. Huang and F. Lombardi, IEEE VLSI Test Symposium (VTS), 2004.

  11. "A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment", Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, S. Max, Phil Perkinson, IEEE Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), pp. 159-166, 2003.

  12. "Emulating Shared-Memory Do-All Algorithms in Asynchronous Message-Passing Systems", D.R. Kowalski, M. Momenzadeh and A.A. Shvartsman, International Conference On Principles of Distributed Systems, Springer -LNCS series, pp. 210-222, 2003.

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 [ Northeastern University]  [ Elecrical and Computer Engineering ]  [ Test and Reliability Group ]  [ Tehran ]