Information about Test & Reliability Group (TRG)

Welcome to Test & Reliability Group (TRG) at the Electrical & Computer Engineering Department at Northeastern University, Boston, MA.

The TRG laboratory was established in 1998. The overall activity at the TRG lab focuses on test and reliability issues in VLSI and nano systems.

The current research includes:

· Design, test, and fault tolerance of Quantum-dot Cellular Automata (QCA)

· Soft Error rate estimation and tolerance in VDSM VLSI

· Fault tolerance of FPGA architectures

· Automatic Test Pattern Generation (ATPG) for timing failures

· Defect and fault tolerance of reconfigurable molecular computing

· Timing noise measurements in Automatic Test Equipments (ATE)

· Reliability issues in very deep sub-micron (VDSM) VLSI designs 

The current research activities is organized into some projects with the following themes:

· Automatic Test Equipment (ATE) & Built-In Self Test (BIST)

· Quantum dot Cellular Automata

· Soft Errors

· System Level Soft Error Rate Estimation

· Soft Error Rate Estimation and Mitigation of SRAM-Based FPGAs

· Reliability of the Cache Memory Hierarchy

· ATPG for Timing Failures

· Testing and Fault Tolerance of FPGAs

· Substrate Noise Analysis for Mixed-Signal VLSI Designs