Research Interests:

Battery management system with multiple batteries/chargers

Publications

Refereed Journal Papers:

[1] Jen-Chou Tseng, Chung-Ti Hsu, Chia-Ku Tsai, Shu-Chuan Chen, Ming-Dou Ker, “Board level ESD of driver ICs on LCD panel,” IEEE Transactions on Device and Materials Reliability, Nov. 2008 (SCI, EI).
[2] Ching-Fa Yeh, Shuo-Cheng Wang, Chung-Ti Hsu, and Jen-Chung Lou, "Fabricating thin-film transistors on plastic substrates using spin etching and device transfer,” Journal of the Electrochemical Society 152 (3): G227-G233, 2005 (EI).

Conference Papers:

[3] Chung-Ti Hsu, Peng Li, Su Sheng, Brad Lehman, "A Maximum Power Point Tracking Method for PV Systems Supplying a Periodic Nonlinear Load," Fifth IEEE Energy Conversion Congress & Exposition (ECCE), Denver, CO, USA, 2013, pp 2771-2777.
[4] Chung-Ti Hsu, Su Sheng, Qian Sun, Peng Li, Bradley Lehman, "Increased Energy Delivery for Parallel Battery Packs with No Regulated Bus," 34th International Telecommunications Energy Conference (INTELEC 2012), Scottsdale, AZ, 2012.
[5] Song Chen, Stephanie Quinn, Chung-Ti Hsu, Brad Lehman, "Estimation Method of DC Wire Losses in Photovoltaic Systems," 34th International Telecommunications Energy Conference (INTELEC 2012), Scottsdale, AZ, 2012. (Poster session)
[6] Jen-Chou Tseng, Chung-Ti Hsu, Chia-Ku Tsai, Yu-Ching Liao and Ming-Dou Ker, “ESD protection design for low trigger voltage and high latch-up immunity,” in Proc. of 2010 IEEE International Physical and Failure Analysis of Integrated Circuits (IPFA), 2010, pp.1-4.
[7] Chung-Ti Hsu, et al., “Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high- voltage CMOS/DMOS technologies,” in Proc. of 2008 IEEE Asia Pacific Conference On Circuits And Systems (APCCAS), Macao, China, Nov.30-Dec.3, 2008, pp. 49-52.
[8]Jen-Chou Tseng, Yu-Lin Chen, Chung-Ti Hsu, Fu-Yi Tsai, Po-An Chen, Ming-Dou Ker, "Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits”, in Proc. of 2008 IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, Apr. 26-May 1, 2008, pp. 625-626.
[9] Chung-Ti Hsu, Jen-Chou Tseng, Yu-Lin Chen, Fu-Yi Tsai, Shen-Hao Yu, Po-An Chen, Ming-Dou Ker, "Board level ESD of driver ICS on LCD panels,” in Proc. of 2007 IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, Apr. 15-19, 2007, pp. 590-591.
[10] I-Cheng Lin, Chuan-Jane Chao, Ming-Dou Ker, Jen-Chou Tseng, Chung-Ti Hsu, Lien-Yi Lu, Yu-Lin Chen, Chia-Ku Tsai, and Ren-Wen Huang, "Latchup test-induced failure within ESD protection diodes in a high-voltage CMOS IC product,” in Proc. of 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Grapevine, Texas, USA, Sept. 19-23, 2004, pp. 160- 165.
[11] Shuo-Cheng Wang, Chung-Ti Hsu, Ching-Fa Yeh, and Jen-Chung Lou, "Fabrication of thin film transistors on plastic substrates by spin etching and device transfer process,” in Proceedings of the SPIE, Volume 5276, pp. 376-383 (2004).
[12] Chung-Ti Hsu, I-Cheng Lin, Jen-Chou Tseng, Ming-Dou Ker, Yu-Lin Chen, Fu-Yi Tsai, Shen-Hao Yu, Fu-Hsing Chen, Po-An Chen, "A p-i-n latch-Up failure and the latch-up trigger current induced NPN snapback Effect in a high-voltage IC Product,” in Proceedings of 2006 Taiwan ESD Symposium, pp. 53-56.
[13] Chia-Ku Tsai, Chung-Ti Hsu, Jen-Chou Tseng, I-Cheng Lin, Yu-Lin Chen, Ren-Wen Huang, Fu-Yi Tsai, and Len-Yi Leu, ”Novel SCR aided gate coupled NMOS transistor electrostatic discharge protection circuit,” in Proc. of 2005 Taiwan ESD Symposium, Nov. 14-16, 2005, pp. 136-139.
[14] Chung-Ti Hsu, Jen-Chou Tseng, Chia-Ku Tsai, I-Cheng Lin, Yu-Lin Chen, Ren-Wen Huang, Po-Chih Su, and Len-Yi Leu, "Novel gate-coupled high-voltage-tolerant electrostatic discharge protection circuit", in Proc. of 2005 Taiwan ESD Symposium, Oct. 18-20, 2004, pp. 68-71.
Published several ESD/Latchup related technical papers in 2004-2009

Patents

[1] US patent: 7538998 (ESD related)
[2] US patent application: US20110121394, US20100128401, US20110128658 (ESD related)
Three Taiwan (R.O.C.) patents

Awards

Affiliations