418 Dana Research Center
Dept. of Electrical & Computer EngineeringNortheastern UniversityBoston, MA 02115
Battery management system with multiple batteries/chargers
Refereed Journal Papers:
 Jen-Chou Tseng, Chung-Ti Hsu, Chia-Ku Tsai, Shu-Chuan Chen, Ming-Dou Ker, “Board level ESD of driver ICs on LCD
panel,” IEEE Transactions on Device and Materials Reliability, Nov. 2008 (SCI, EI).
 Ching-Fa Yeh, Shuo-Cheng Wang, Chung-Ti Hsu, and Jen-Chung Lou, "Fabricating thin-film transistors on plastic substrates using spin etching and device transfer,” Journal of the Electrochemical Society 152 (3): G227-G233, 2005 (EI).
 Chung-Ti Hsu, Peng Li, Su Sheng, Brad Lehman, "A Maximum Power Point Tracking Method for PV Systems Supplying a Periodic Nonlinear Load," Fifth IEEE Energy Conversion Congress & Exposition (ECCE), Denver, CO, USA, 2013, pp 2771-2777.
 Chung-Ti Hsu, Su Sheng, Qian Sun, Peng Li, Bradley Lehman, "Increased Energy Delivery for Parallel Battery Packs with No Regulated Bus," 34th International Telecommunications Energy Conference (INTELEC 2012), Scottsdale, AZ, 2012.
 Song Chen, Stephanie Quinn, Chung-Ti Hsu, Brad Lehman, "Estimation Method of DC Wire Losses in Photovoltaic Systems," 34th International Telecommunications Energy Conference (INTELEC 2012), Scottsdale, AZ, 2012. (Poster session)
 Jen-Chou Tseng, Chung-Ti Hsu, Chia-Ku Tsai, Yu-Ching Liao and Ming-Dou Ker, “ESD protection design for low trigger voltage and high latch-up immunity,” in Proc. of 2010 IEEE International Physical and Failure Analysis of Integrated Circuits (IPFA), 2010, pp.1-4.
 Chung-Ti Hsu, et al., “Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high- voltage CMOS/DMOS technologies,” in Proc. of 2008 IEEE Asia Pacific Conference On Circuits And Systems (APCCAS), Macao, China, Nov.30-Dec.3, 2008, pp. 49-52.
Jen-Chou Tseng, Yu-Lin Chen, Chung-Ti Hsu, Fu-Yi Tsai, Po-An Chen, Ming-Dou Ker, "Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits”, in Proc. of 2008 IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, Apr. 26-May 1, 2008, pp. 625-626.
 Chung-Ti Hsu, Jen-Chou Tseng, Yu-Lin Chen, Fu-Yi Tsai, Shen-Hao Yu, Po-An Chen, Ming-Dou Ker, "Board level ESD of driver ICS on LCD panels,” in Proc. of 2007 IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, Apr. 15-19, 2007, pp. 590-591.
 I-Cheng Lin, Chuan-Jane Chao, Ming-Dou Ker, Jen-Chou Tseng, Chung-Ti Hsu, Lien-Yi Lu, Yu-Lin Chen, Chia-Ku Tsai, and Ren-Wen Huang, "Latchup test-induced failure within ESD protection diodes in a high-voltage CMOS IC product,” in Proc. of 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Grapevine, Texas, USA, Sept. 19-23, 2004, pp. 160- 165.
 Shuo-Cheng Wang, Chung-Ti Hsu, Ching-Fa Yeh, and Jen-Chung Lou, "Fabrication of thin film transistors on plastic substrates by spin etching and device transfer process,” in Proceedings of the SPIE, Volume 5276, pp. 376-383 (2004).
 Chung-Ti Hsu, I-Cheng Lin, Jen-Chou Tseng, Ming-Dou Ker, Yu-Lin Chen, Fu-Yi Tsai, Shen-Hao Yu, Fu-Hsing Chen, Po-An Chen, "A p-i-n latch-Up failure and the latch-up trigger current induced NPN snapback Effect in a high-voltage IC Product,” in Proceedings of 2006 Taiwan ESD Symposium, pp. 53-56.
 Chia-Ku Tsai, Chung-Ti Hsu, Jen-Chou Tseng, I-Cheng Lin, Yu-Lin Chen, Ren-Wen Huang, Fu-Yi Tsai, and Len-Yi Leu, ”Novel SCR aided gate coupled NMOS transistor electrostatic discharge protection circuit,” in Proc. of 2005 Taiwan ESD Symposium, Nov. 14-16, 2005, pp. 136-139.
 Chung-Ti Hsu, Jen-Chou Tseng, Chia-Ku Tsai, I-Cheng Lin, Yu-Lin Chen, Ren-Wen Huang, Po-Chih Su, and Len-Yi Leu, "Novel gate-coupled high-voltage-tolerant electrostatic discharge protection circuit", in Proc. of 2005 Taiwan ESD Symposium, Oct. 18-20, 2004, pp. 68-71.
Published several ESD/Latchup related technical papers in 2004-2009
 US patent: 7538998 (ESD related)
 US patent application: US20110121394, US20100128401, US20110128658 (ESD related)
Three Taiwan (R.O.C.) patents