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| Research Areas | ||
| VLSI Testing and Design Automation, Reliable System Design, Nano-Computing, Reconfigurable Computing |
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Biography |
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Mehdi Baradaran Tahoori received his Ph.D.
in Electrical Engineering
from Stanford University in 2003 under supervision of Prof. E.J.
McCluskey. He received his M.S. in Electrical Engineering from Stanford
University in 2002, and B.S. in Computer Engineering from Sharif University
of Technology, Tehran, Iran in 2000. Before his appointment at Northeastern
University, he was a research scientist at Fujitsu Labs working on Advanced
CAD group.
Dr. Tahoori has published
more than 60 technical papers in leading
conferences and journals, and invented techniques for fault localization
and noise analysis that have seen wide-spread proliferation in the industry.
Dr. Tahoori has served as the Program Chair of the IEEE Defect Based Testing Workshop for 2005 and 2006, and is currently the co-sponser the IEEE Test Technology Technical Council technical activity committee on Testing of Nanobased Devices and Systems. He was the guest editor for IEEE Design & Test Special Issue on Advanced Technologies and Reliable Design for Nanotechnology Systems, 2005. He has served on the organizing and program committees of several IEEE-sponsored conferences and workshops, including the IEEE North Atlantic Test Workshop, the IEEE International Test Synthesis Workshop, and the IEEE International Workshop on Design and Test of Defect-Tolerant Nanoscale Architectures.