Homework #4
ECE 3626 - Integrated Circuit Fabrication
Problem 1
A high performance photoresist process is able to form an image when the MTF> 0.2. Plot Wmin vs. S for a 248 nm light source with a NA of 0.5. Compare this result with a low contrast resist process that requires the MTF > 0.7.
Problem 2
Chapter 8, problem 1
Problem 3
Chapter 8, problem 9
Problem 4
Chapter 8, problem 11